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Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations

Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations

By: Amos Tversky, David H. Krantz, Patrick Suppes, R. Duncan Luce

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All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurement, established the formal foundations for measurement, justifying the assignment of numbers to objects in terms of their structural correspondence.
Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance.

Reprint of the Academic Press, New York and London, 1989 edition.
AvailabilityUsually ships in 24 to 48 hours
ISBN 100486453154
ISBN 139780486453156
Author/EditorAmos Tversky, David H. Krantz, Patrick Suppes, R. Duncan Luce
Page Count512
Dimensions5 1/2 x 8 1/2

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